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CFA Submission Deadline Extended to April 11, 2024

Call for Abstracts for Speakers + Posters

ELEVATE YOUR COMPANY'S BRAND

Submit an abstract to speak or present a poster at the Test Vision Symposium @ SEMICON West. the premier event for the semiconductor industry. This is a great opportunity to demonstrate your expertise, showcase your innovations, and engage with like-minded industry leaders, professionals, and enthusiasts.

EDUCATE—Share your expertise

CONNECT—Meet with peers 

INFLUENCE—Expand your circle

Key topics are below. Please note, this is not an exclusive list—
any topic related to semiconductor test is welcome.

TEST IN THE SEMICONDUCTOR FUTURE

Test Vision at SEMICON WEST is one of today’s premier gatherings of semiconductor test experts and visionaries. The goal of Test Vision is not just to discuss the latest developments in test equipment and methodologies, but to present a vision of the future of test. The conference is well attended, assuring access to a wide range of expertise and experience.  This year’s theme is Test in the Semiconductor Future, focuses on the increasing prevalence of semiconductors in new areas and fields such as electric vehicles (EV), consumer electronics, and further advances in high-performance computing and AI.

Test is a critical part of the semiconductor manufacturing process and while much attention is paid to the manufacturing of wafers themselves, no one would be able to ship viable products to customers without test. Test not only screens out defective units but frequently functions as a process step to tune and adjust for parametric variations in the wafer process through trim routines. Test is a unique field within the semiconductor industry. Driving innovation in test is required to enable innovation in both manufacturing process and design, as well as to reduce the cost of manufacturing enabling more end markets and penetration of semiconductors to more applications.

The new “Semiconductor Future” will have more material in more applications. Expanded safety critical systems will rely on the quality of semi manufacturing, and thus on test. New technologies such as heterogeneous integration, chiplets, wide bandgap materials, THz RF frequencies, and, in general, the increasing power that must be both consumed and maneuvered by semiconductors all contribute to an increasing complexity in test with new and difficult challenges to overcome. Test Vision aims to create an open exchange of ideas about this field, and foster discussion that is a true vision of the future of test, and not just a reflection of the past half-century. 

TOPICS

Power / Power Delivery

        - Co-packaging Power Processes (modules)

        - Wide Bandgap (SiC , GaN) Test

        - Isolation and High Voltage Test

        - Power Test and Power Test Methods

        - Battery Management Systems (BMS) Test

        - PMIC and Power Stage Test

Digital Test

        - Leading Edge Process Nodes

        - Advanced Packaging & Chiplets

        - Testing AI

        - Advanced Scan

        - Security

Test Infrastructure

        - Wafer-level Burn-in

        - Handling High Current in Test (Sockets, Needles, PCBs)

        - Pushing the Density of Probe Arrays

        - Advanced Handling (Robotization, High-Multi Site)

       - Using AI in Testing

        - Data Management and Data Analytics

   

        - Active Thermals

        - EDA-to-ATE

        - Real-time Analytics & Control

Interfaces & Sensors 

        - PCIe, UCIe, MIPI, etc.

        - Sensors & Transducers (Humidity, Pressure, etc.)

         - Photonics ICs & Interconnects

        - RF (mmWave, radar, UWB, WiFi, 6G)

        - Image Sensors

        - MicroLED / OLED

Test Trends

        - On-Die Test Agents (BIST, I-JTAG, Cache Resident Test)

        - System Level Test

        - Supporting Co-simulation

        - Post-Silicon Validation

        - Productivity Improvements (Tools)

         - Standardized Test Language

        - High Reliability ICs (Automotive, Healthcare, Consumer)

        - Impact on On-shoring

PARTICIPATE IN THE POSTER SESSION 

The Test Vision Poster Session is always a highly anticipated interactive and thought-provoking activity We encourage seasoned test experts, as well as students, post-docs, and others with exciting observations to share on how your process has adapted to the ever-changing realities of test. 
 

POSTER SESSION GUIDELINES 

  • 1m x 1m size for all posters.
  • Underline the name of the presenting author in the poster text.
  • Poster set-up: Wednesday by noon, July 10
  • Be prepared to present during the breaks and reception. 

 

QUESTIONS?

For more information on the Test Vision Symposium or if you're interested in sponsoring and branding your company to the test community, please contact:

Mayura Padmanabhan
[email protected]
 

Paul Trio
[email protected]
+1.408.943.7041