Optimizing Your Manufacturing—Predicting the Smart Way
Wednesday, December 8 | 10:30 am - 12:30 pm
Smart Manufacturing Pavilion
Agenda
The Importance of Data Ontology, Security, and Continuity to Establish Predictive Data Analytics
Steve Johnston
EMD Electronics
Jeremy Elser
Palantir
10:35 am - 10:55 am
Implementing Smart Metrology Sampling and Tool Defect Metrology Risk Monitoring
Chris Bode
INFICON
Caitlyn Backes
Skywater
10:55 am - 11:15 am
Accelerating Data Analytics, Artificial Intelligence, and Machine Learning for Smart Fab with AWS
Erick Irigoyen
Amazon Web Services (AWS)
11:15 am - 11:35 am
Panel Discussion—Optimizing Your Manufacturing - Predicting the Smart Way
Erick Irigoyen
Amazon Web Services (AWS)
Chris Bode
INFICON
Steve Johnston
EMD Electronics
Jeremy Elser
Palantir
Caitlyn Backes
Skywater
11:35 am - 12:05 pm
Using Machine Learning to Improve Our Understanding of Process Risks During the Development of Next Generation Semiconductor Technology [Pre-Recorded]
Joseph Ervin
Lam Research
12:05 pm - 12:25 pm