From Nanometer to Terahertz: Future Test Innovation Opportunities—Day 2 of 2

Thursday, December 9 | 9:00 am - 3:30 pm
Moscone South, Lower Level, Room 9

The simultaneous arrivals of 5G, AI, IoT, and Cloud Computing are creating explosive demand for new semiconductor technologies. From the client endpoint connection all the way to the data center core, seamless solutions are required for communications, processing, and storage. The chips enabling these solutions to bring with them a myriad of test challenges that now span the digital, analog, RF, and optical domains. In addition, the use of heterogeneous integration – including the emerging chiplet strategies – combined with the latest 7nm and 5nm nodes, put more functionality into single devices than ever before. To address these challenges, test teams must leverage all the tools in their arsenal to ensure quality, including: advanced test instrumentation, intelligent test flows, Design for Test, Built-In Self Test, and System Level Test.


Day 1 Keynote

  • Jay Rathert | Sr. Director, Strategic Collaborations | KLA

Session 1—Big Digital Test Challenges and Trends

  • Ken Butler | Strategic Business Creation Manager | Advantest
  • Amy Leong | SVP/CMO/GM Emerging Growth Business Unit | FormFactor
  • Tucker Davis | Product Manager | Teradyne
  • Invited Speaker—Dan Hutcheson | CEO | VLSI Research

Session 2—mmWave and THz

  • Jeorge Hurtarte | Principal Marketing Technologist | Teradyne
  • Daniel Bock | Advanced RF Applications Specialist | FormFactor
  • Brandon Liew | RF Product & Applications Engineering Manager | FormFactor
  • Adrian Kwan | Senior Business Development Manager | Advantest

Day 2 Keynote

  • Chandran Nair | CEO | AEM

Session 3—Big Digital Test Challenges and Trends

  • David Raschko | Product Marketing Manager | FormFactor
  • Geir Eide | Director, Product Management | Siemens Digital Industries Software
  • Dave Armstrong | Principal Test Strategist | Advantest
  • Matthew Knowles | Director, Operations Product Management | Siemens Digital Industries Software

Session 4—Test Innovations in Image Sensors, Memory, and Data Analytics

  • Christos Pantelidis | Field Application Engineer | Teradyne
  • Myung Jin Lee | Director, Product Marketing | FormFactor
  • Marc Hutner | Sr Director of Marketing | proteanTecs

Poster Presentations

  • Chris Tran | HPC Business Development Manager for SLT and BI | Advantest
  • Vincent Chu | Senior Manager, Advantest Cloud Solutions | Advantest
  • Sang-Joon Cho | Director | Park Systems
  • Tom Tran | Product Manager | Teradyne

VIEW THE FULL AGENDA