Optimizing Your Manufacturing—Smart Solutions with Real Benefits
Wednesday, December 8 | 2:00 pm - 4:00 pm
Smart Manufacturing Pavilion
Agenda
New Metrology Technique for Measuring Wafer Geometry on a Full 300mm Silicon Wafer
Jan Gaudestad
Wooptix
2:05 pm - 2:25 pm
Challenges and Opportunities of Electron Microscopy for FinFET Characterization
Jiangtao Zhu
Eurofins Nanolab Technologies
2:25 pm - 2:45 pm
ML/AI for Performance Optimization in Semiconductor Manufacturing & Advanced Packaging
Dongkai Shangguan, PhD
Adapdix
2:45 pm - 3:05 pm
Smarter Fab Operations—AI-Driven Equipment Performance Visibility
Nikunj Mehta
Falkonry
3:05 pm - 3:25 pm
Panel Discussion—Optimizing Your Manufacturing - Smart Solutions with Real Benefits
Jan Gaudestad
Wooptix
Jiangtao Zhu
Eurofins Nanolab Technologies
Dongkai Shangguan, PhD
Adapdix
Nikunj Mehta
Falkonry
3:25 pm - 3:55 pm